Materials Research

Understanding tomorrow’s materials

X-ray analysis is a valuable tool for the research and development of advanced materials. PANalytical’s unique product range includes a revolutionary XRD platform that can be used for the characterization of the widest range of samples, materials and applications with no compromise in data quality. Flexibility is built in to our XRF systems too, with light element analysis, Fundamental Parameter Multi Layer analysis, and unparalleled standardless analysis delivering reliable quantification of new materials.

Why X-ray analysis?

XRF and XRD techniques provide the answers to important questions of elemental and structural analysis:

• Phase identification - is it a pure phase or does the material contain impurities as a result of the production process
• The quantification of mixtures of phases
• The degree of crystallinity of the phase(s)
• The crystallographic structure of the material - space group determination and indexing, structure refinement and ultimately structure solving
• The degree of orientation of the crystallites - texture analysis.
• The deformation of the crystallites as a result of the production process: residual stress analysis
• The influence of non-ambient conditions (also in-situ) on these properties
• The determination of layer and coating thicknesses, densities and roughnesses
• Analysis of epitaxial layers, heterostructures and superlattice systems

PANalytical leadership

• Best in class XRF and XRD systems
• Pair distribution function (PDF) analysis and Small-angle X-ray scattering (SAXS) give information on amorphous state, and allow investigation of nano-crystalline compounds or determination of their specific surface
• Computed tomography (CT) is an additional tool for the analysis of the morphology of small solid objects, allows the investigation of new materials such as fabrics - and new properties, inner structure or pore distributions, for example
  
  

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