NanotechnologyAnalyzing nanosized dimensions In nanotechnology, knowledge of the material structure and composition over small distances is a key requirement for understanding the materials properties. X-ray diffraction is the ideal tool for the nanoscientist; it reveals structural information over a macroscopic sample volume at the nanoscale. A PANalytical XRD instrument should therefore not be missing in a modern research laboratory for advanced and nanomaterials.
PANalytical delivers a number of dedicated solutions for nanostructural problems. Highly perfect structures can be measured using the Empyrean X-ray diffraction system with high-resolution optics. Empyrean handles a full range of thin film applications, including X-ray reflectometry, in-plane diffraction and epitaxy and orientation analysis. For polycrystalline nanomaterials, the Empyrean system will demonstrate its applicability for e.g. phase identification, size-strain analysis, SAXS or pair distribution function analysis. Combined with PANalytical’s fast X-ray detectors and software packages, Empyrean provides straightforward size and shape analysis of nanoparticles.
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