Nanotechnology

Analyzing nanosized dimensions

In nanotechnology, knowledge of the material structure and composition over small distances is a key requirement for understanding the materials properties. X-ray diffraction is the ideal tool for the nanoscientist; it reveals structural information over a macroscopic sample volume at the nanoscale. A PANalytical XRD instrument should therefore not be missing in a modern research laboratory for advanced and nanomaterials.


PANalytical nanotechnology solutions

PANalytical delivers a number of dedicated solutions for nanostructural problems. Highly perfect structures can be measured using the Empyrean X-ray diffraction system with high-resolution optics. Empyrean handles a full range of thin film applications, including X-ray reflectometry, in-plane diffraction and epitaxy and orientation analysis. For polycrystalline nanomaterials, the Empyrean system will demonstrate its applicability for e.g. phase identification, size-strain analysis, SAXS or pair distribution function analysis. Combined with PANalytical’s fast X-ray detectors and software packages, Empyrean provides straightforward size and shape analysis of nanoparticles.


For all these applications, the required system components can easily be picked and placed for optimal results, thanks to PANalytical’s proven PreFIX approach. Moreover the large range of non-ambient chambers makes it possible to study nanomaterials at a wide temperature and pressure range.


Product choices

Empyrean The one XRD platform that does it all. Maximum performance, maximum flexibility - handles all applications and all sample types
HighScore PANalytical's software package for phase identification, crystallography and Rietveld analysis - determines average crystallite size and strain
EasySAXS Easy-to-use software package for the automated analysis of SAXS data from nanopowders, nanoparticle dispersions, nanocomposites and porous materials
Reflectivity PANalytical's software for analysis of X-ray reflectometry data - offers powerful options to characterize single and multi layer structures of nanometer-sized thin films
PDF analysis Structural characterization of nanocrystalline and amorphous materials using high-energy X-rays 

 

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