Data CollectorData Collector gives users of PANalytical's XRD systems a powerful central control module for all their XRD measuring routines. Running under Windows XP or Windows 2000, the module delivers easy setup and configuring of XRD systems in combination with data collection functionality, even in 21 CFR Part 11 regulated environments.
Data Collector holds an inventory of all the optical components, instrument types and settings in the current configuration. Before a measurement routine is started, a complete system validation helps prevent unachievable or potentially hazardous actions. System default settings enable novice users to start measuring straight away. Experienced users can develop optimum measurement strategies, including complex routines for special applications.
Besides basic θ-2θ operation, scans can be made using axes including 2θ only, ω (angle of incidence), ω-2θ with/without offset between ω and θ, ψ (tilt axis), φ (rotation about the normal to sample surface), x (sample translation), y (sample translation), and z (sample height). More complex results include stress, sample texture, Q-scans (straight lines in reciprocal space), and sample and reciprocal space mapping Current version: 3.0 |
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