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Solutions for XRD and beyond
X-ray diffraction (XRD), X-ray scattering techniques and computed tomography (CT) are versatile, non-destructive methods that reveal detailed information about the chemical composition, crystallographic and micro structure of all types of natural and manufactured materials. PANalytical offers comprehensive solutions for a broad range of XRD and X-ray scattering applications. For market sectors including materials research, universities and colleges, building materials, metals, minerals, plastics, pharmaceuticals and semiconductors, our products provide highly accurate analysis. PANalytical systems are supported by unmatched applications expertise and an extensive range of advanced software tools. We are proud that users report that PANalytical systems are the most technically advanced and cost-effective diffraction solutions imaginable.
PANalytical leadership
The expansion of X-ray diffraction and scattering techniques out of the research lab and intro routine use and production control can be mapped against a series of technology and software developments, such as ultra-fast detectors, pioneered by PANalytical.
- Unique goniometers with Direct Optical Position Sensing, designed for years of continuous top performance
- True solid-state X-ray detection technology, co-developed with CERN and other leading detector physics institutes
- PIXcel3D: the world’s only area detector which excels in 0D, 1D and 3D measurements
- A complete suite of state-of-the-art analysis software packages, designed for ease of use, and supported by extensive documentation and tutorials
- A worldwide network of XRD specialists ready to answer your application questions
Product choices
| System |
Description |
Typical Segment / Application |
| Empyrean |
The only XRD platform that does it all |
The ultimate system for cutting-edge materials research – handles all sample types with no compromise in data quality |
| X'Pert PRO MRD and MRD XL |
The proven standard for thin film analysis |
For research and production control of thin films – full wafer mapping up to 4” (MRD) or 200 mm (MRD XL), can be automated with C-to-C wafer loader |
| CubiX3 |
The #1 industrial powder diffractometer |
The world’s fastest, fully automatable black box powder diffractometer for process control applications, supported by PANalytical’s unrivalled worldwide support network |
| X'Pert Powder |
Powder diffraction for everyone |
Affordable, full-power powder diffractometry with possibilities for future expansion. Ideal for educational institutes |
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