Omnian

The benchmark for standardless analysis software  

PANalytical’s Omnian package is the perfect solution for characterization and analysis of unknown samples, or in situations where certified standards that match specific sample characteristics are not available.  

Omnian is a module of the proven SuperQ, Epsilon 3 and MiniPal 4 software suites and is designed to be used in conjunction with PANalytical’s Axios sequential wavelength dispersive XRF (WDXRF) and Epsilon 3 and MiniPal 4 benchtop energy dispersive XRF (EDXRF) spectrometers.  

Easy to use

It is designed to provide fast, reliable quantification in the default ‘black box’ mode. However, the data collected is comprehensive and can be reviewed more extensively.


Watch Ian Campbell, Product Manager at PANalytical, demonstrate how easy it is to use Omnian when analyzing an unknown sample in the default ‘blackbox’ mode.
Stay tuned for more Omnian demonstrations.   


Ready for any sample

The software includes smart features that automatically adjust to sample and matrix effects as well as sample thickness (FT), Fluorescence Volume Geometry (FVG) and ‘Dark–Matrix’ composition. It can be fine-tuned for increased accuracy by using Adaptive Sample Characterization (ASC).  

Problem solving power for your analytical challenges

Omnian can handle a wide variety of sample types such as solids, pressed powders, fused beads, loose powders and liquids. The package has the power to deal with analytical challenges such as:

  • Quantitative analysis
  • Rapid screening
  • R&D analysis
  • Failure analysis
  • Comparative analysis  

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