XRF

X-ray Fluorescence Spectrometry

XRF (X-ray fluorescence spectrometry) is a non-destructive analytical technique used to identify and determine the concentrations of elements present in solid, powdered and liquid samples.

XRF is capable of measuring elements from beryllium (Be) to uranium (U) and beyond at trace levels often below one part per million and up to 100%.

The XRF spectrometer measures the individual component wavelengths of the fluorescent emission produced by a sample when irradiated with X-rays.

WDXRF

WDXRF (wavelength dispersive X-ray fluorescence) separation is achieved by diffraction, using an analyzer crystal that acts as a grid. The specific lattice of the crystal selects the correct wavelengths according to Bragg's Law.

A WDXRF spectrometer provides:

• the advantages of total application versatility
• optimal measurement conditions programmable for each element
• excellent light-element performance
• very high sensitivity and low detection limits.

EDXRF

EDXRF (energy dispersive X-ray fluorescence) spectrometry works without a crystal.

An EDXRF spectrometer includes special electronics and software modules to take care that all radiation is properly analyzed in the detector. It provides a lower cost alternative for applications where less precision is required. The high-end Epsilon 5 XRF spectrometer uses the 3D EDXRF techniques featuring a 3-dimensional, polarizing optical geometry.