PANalytical has an extensive portfolio of XRF spectrometers and related products for elemental and thin-film thickness analysis, suited for a variety of analytical and sample throughput requirements and operating environments. Spectrometers range from low-power, benchtop energy dispersive XRFs systems to high-power wavelength dispersive XRF systems and niche products for the semiconductor metrology.
These instruments can be configured with dedicated software options for specific types of analyses, combined with applications modules (application setup, calibration and standards) or packaged with sample preparation equipment to give complete analytical solutions. All PANalytical products are backed up by our after sales and service organization and PANassist.
Read more in our knowledge center about the many exciting XRF applications you can do with our equipment.