X'Pert³ MRD (XL)

Features

The standard research and development version for use with thin films samples, wafers (complete mapping up to 100 mm) and solid materials.

Specifications

The X'Pert³ MRD systems offer advanced and innovative X-ray diffraction solutions from research to process development and process control.

What can it do for you?

The X’Pert³ MRD system handles a wide range of applications, and is especially suitable for thin film analysis applications.

Data Collector

Data Collector is your control board for all measurements on powders, thin films, nanomaterials and solid objects.

Now used in materials research

Materials characterization is of importance for many applications, from renewable energy materials to novel nanomaterials.

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What is XRD?
Materials research

X-ray diffraction is the only laboratory technique that reveals structural information.
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