PANalytical launches Epsilon 1 for small spot analysis
17 July 2017, Almelo, the Netherlands
Focus on the details to capture the bigger picture.
PANalytical, world’s leading supplier of analytical X-ray instrumentation, software and expertise, announces the introduction of a new Epsilon 1 X-ray fluorescence (XRF) spectrometer. This new member of the Epsilon 1 family has been designed for small spot analysis, and is the most powerful benchtop spectrometer in its class. It provides a compact and cost-effective ‘out-of-the-box’ solution, ready for the analysis of small objects or small inclusions in rocks, electronic appliances, toys, jewelry or finished products.
The instrument can handle a large variety of sample types, from small objects to larger final products. They can all be placed directly in the spectrometer without the need of any sample preparation. The integrated color camera allows straightforward positioning of the sample directly in front of the small measurement spot. The small footprint and self-contained design make the Epsilon 1 an ideal solution for elemental analysis and can be placed close to the sample location, like production facilities, exploration sites, at a shop’s counter or even taken to crime scenes for forensic investigation.
The performance of the spectrometer meets the standard test methods required by different directives and regulations in various industry markets, like RoHS-2, WEEE and ELV for electronics and CPSIA for consumer goods. The Epsilon 1 is specifically designed to analyze a wide range of samples in accordance to these regulations, and meets the performance required by international test methods like ASTM F2617 for RoHS-2.
“The combination of hardware and software in the Epsilon 1 for small spot analysis provides you with flexible and robust spot-on elemental analysis”, according to Dr. Lieven Kempenaers, benchtop product manager at Malvern PANalytical.
Find out more about the compact and robust Epsilon 1 for small spot analysis.