Value beyond analysis
Energy dispersive X-ray fluorescence spectrometer for the elemental analysis range from carbon (C) to americium (Am) and the concentration range from sub-ppm to 100 wt%.
Use Omnian for standardless analysis, use FingerPrint for material testing when analysis speed is important or use Stratos for a rapid, simple and non-destructive analysis of coatings, surface layers and multi-layered structures. One could also use Enhanced Data Security which supports compliancy with regulations like FDA 21 CFR Part 11 or use Oil-Trace for quantifying fuel-biofuel mixtures to fresh and used lubricating oils.
Key specifications and options
|Sample handling||X-ray tube||Detector||Software|
|10-position removable sample changer||Metal-ceramic side window for maximum stability||High-resolution silicon drift detector (SDD), typically 135 eV @ Mn-Kα||Elemental screening with Omnian standardless analysis solution|
|Spectrometer can accommodate samples up to 52 mm (2 inch) in diameter||50 micrometers thin beryllium window for high sensitivity for light elements (Na, Mg, Al, Si)||Max count rate of 1,500,000 counts/s at 50% dead time||PASS/FAIL analysis with FingerPrint solution|
|Spinner is included for better accuracy of air filter analysis||Ag anode X-ray tube for best performance of P, S and Cl analysis||Thin-entrance detector window for high sensitivity||Enhanced Data Security for regulated environments|
|Large sample mode for analyzing bigger samples up to 10 cm in height||Stratos for multi-layered samples|
|One flexible calibration for wear metals in fresh and used lubricating oils using Oil-Trace|