SuperQ Thin Film

SuperQ Thin Film, PANalytical
Features

SuperQ Thin Film is based on PANalytical’s SuperQ, the XRF analysis software platform that is used with PANalytical's XRF spectrometers.

SuperQ Thin Film, PANalytical
Specifications

SuperQ Thin Film is based on PANalytical’s SuperQ, the XRF analysis software platform that is used with PANalytical XRF spectrometers.

PANalytical
Determination of composition and thickness of thin films and multi-layers

FP Multi enables simultaneous determination of chemical composition and thickness of layered materials.

PANalytical
Automated wafer production environments

GEM200 is the PANalytical software module that enables users to easily and reliably interface with the wafer production host.

PANalytical
Communications for use in automated 300 mm wafer production environments

GEM300 is the catch-all name for the SEMI standards that address 300 mm automation.

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