Stratos

  • Stratos, PANalytical

    Stratos

     

    The Stratos module features an algorithm which enables simultaneous determination of chemical composition and thickness of layered materials from measurements taken. The software provides a rapid, simple and non-destructive means of analyzing coatings, surface layers and multi-layered structures. The Virtual Analyst provides intelligence during the setup of measurement programs for complicated stacks.

    Available for both the Epsilon 3X range EDXRF and Zetium XRF spectrometers, Stratos delivers fast and reliable results regardless of sample type or matrix.

Stratos, PANalytical
Features

Stratos can achieve excellent results with instruments calibrated using reference samples, whose composition and layer structure differ from those of the unknown.

Stratos, PANalytical
Specifications

Stratos XRF analysis software enables accurate thickness and composition determination for coating and packaging industries.

Zetium

The Zetium platform represents a revolutionary step in materials analysis with the introduction of fusion of WD- and EDXRF and XRD.

Epsilon 3X spectrometers

Epsilon 3X are benchtop EDXRF spectrometers for elemental analysis in industry process control and research and development.

PANalytical
Now used for metals

Process control and quality control in the metal industry are driven by rapid and accurate chemical analysis.

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