Stratos
 
The Stratos module features an algorithm which enables simultaneous determination of chemical composition and thickness of layered materials from measurements taken. The software provides a rapid, simple and non-destructive means of analyzing coatings, surface layers and multi-layered structures. The Virtual Analyst provides intelligence during the setup of measurement programs for complicated stacks.
Available for both the Epsilon 4 EDXRF and Zetium XRF spectrometers, Stratos delivers fast and reliable results regardless of sample type or matrix.