XRD analysis of thin films

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Reflectivity

Reflectivity is our software package for displaying, simulating and fitting X-ray reflectometry data for thin film thickness determination and more.

Epitaxy

Epitaxy offers a wealth of information on thin heteroepitaxial layers, such as mismatch and relaxation, composition and layer thickness.

HighScore

HighScore, our powder diffraction software, can also be used for phase identification and depth profiling of phases in polycrystalline coatings.

Stress Plus

With our Stress Plus module on top of our Stress software package, residual stresses in polycrystalline films can be determined.

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What is XRD?
Materials research

X-ray diffraction is the only laboratory technique that reveals structural information.
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