Stress analysis

Stress, PANalytical
Features

The software performs sin²ψ residual stress analysis using both classical single-directional and multi-directional (full stress tensor) techniques.

Stress, PANalytical
Specifications

Stress offers complete experimental freedom and the option to analyze combined data from different data files. Additional data can be added at any time.

Empyrean, X-ray diffractometer, PANalytical, XRD
Empyrean

With the Empyrean, PANalytical has set the new standard for a multi-purpose diffractometer.

X'Pert³ MRD (XL), PANalytical
X'Pert³ MRD and MRD (XL)

PANalytical's X'Pert³ Materials Research Diffractometers (MRD) are proven, versatile platforms for X-ray scattering studies.

Stress, PANalytical
Residual stress analysis

X-ray diffraction (XRD) is a well-established, non-destructive method for the determination of residual stress in polycrystalline materials.

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What is XRD?
Materials research

X-ray diffraction is the only laboratory technique that reveals structural information.
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