Reflectivity

Features

Reflectivity features all necessary functions for a quick and reliable analysis of specular and off-specular X-ray scattering data.

Specifications

Reflectivity supports data recorded using PANalytical X-ray diffractometers, from the latest Empyrean to the oldest Philips instrument. The 32-bit application is fully compatible with Windows 7.

X'Pert³ MRD (XL), PANalytical
X'Pert³ MRD and MRD (XL)

PANalytical's X'Pert³ Materials Research Diffractometers (MRD) are proven, versatile platforms for X-ray scattering studies.

Reflectivity, PANalytical
Reflectometry

X-ray reflectometry is an analytical technique for investigating thin layered structures, surfaces and interfaces.

PANalytical, XRD
What is XRD?

X-ray diffraction is the only laboratory technique that reveals structural information and so it is used to analyze a wide range of materials.

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What is XRD?
Materials research

X-ray diffraction is the only laboratory technique that reveals structural information.
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