Analyzing specular and off-specular
X-ray scattering data
Reflectivity is PANalytical’s software package for displaying, simulating and fitting X-ray reflectometry data and for analyzing off-specular (diffuse) scattering data of arbitrary multi-layer structures. Layer thickness, density and roughness of thin-layered samples are easily and quickly quantified.
The features of the software make reflectometry, formerly the preserve of highly professional researchers, available to routine users.