Easy setup and reporting, comprehensive online help
An intuitive Windows-based user interface ensures easy setup and predefined reports allow fast access to results. There are full reporting facilities, from result reports for a single sample or batch to complete daily, weekly or monthly reports and control graphs of, for example, intensity. Quantify also features a scheduler that allows the diffractometer to start up automatically at any pre-set time and a comprehensive online Help.
Wide range of quantification models with advanced intensity correction
Quantify offers the most complete range of quantification models including General, Straight-Line, Matrix Flushing, Internal Standard, Single- and Dual-line Addition, Relative Intensity Ratio (RIR), and Thin Layer Models. All models are based on a direct measurement of the individual reflections rather than on the interpretation of a complete scan.
Advanced intensity corrections for optimal analytical integrity
A broad range of correction algorithms helps obtain the net intensity of a peak with the highest accuracy. These include overlap corrections using either a fixed correction factor or calibration with a linear multivariate regression formula, monitor drift correction, and background corrections using a range of correction techniques. Counting statistical errors are used to estimate results accuracy in all related measured intensities.