XML Schema versions

XML Schema versions

Version 1.5

• Added Gamma axisType and Gamma scanAxisType; added areaDetectorType and areaDetectorModeType.
• Added element feedbackTime to areaDetectorType; extended measuremenType attribute of measurement element with Computed tomography measurement.

Version 1.4

Added 2Theta-Phi and Phi-2Theta scanAxisType; renamed Psi to Chi in axisType and scanAxisType.

Version 1.3

The differences between version 1.3 and 1.2 are:
• A new optional attribute "SampleMode" is added to the "Measurement" element. This attribute can have one of the following values: "Reflection", "Transmission" or "Capillary".
• The attribute "MeasurementType" of the "Measurement" element is extended with the value "Wobbled Scan". The wobbling axis is defined by the existing attribute "MeasurementStepAxis".

Version 1.2

In version 1.2 Focussing Mirrors are supported by extending the enumeration of the "shape" attribute with "Elliptic". This attribute is part of the "complexType" "crystalType".

Version 1.1

In version 1.1 the optional elements "name" and "preparedBy" have been added to "sampleType".

Version 1.0

<b>Request</b> a quote Request a quote

To help us respond to your request for a quote please fill in the form as completely as possible.

<b>Contact</b> us Contact us

Please use this form to contact us if you require further information.

What is XRD?
Materials research

X-ray diffraction is the only laboratory technique that reveals structural information.
Read more

Global and near

PANalytical has an unrivaled sales and service network covering more than 60 countries.
Read more

Our top XRF products
Contributing to your success

The role PANalytical products play in increasing process productivity. Read more

Contact us
Contact us

Please use this form to contact us if you require further information.
Read more