Data Collector

Data Collector, PANalytical

One consistent workflow for 0D, 1D, 2D and 3D measurements

The PANalytical Empyrean, X’Pert³ MRD (XL) and X’Pert³ Powder platforms provide a range of applications such as phase identification and quantification, small- and wide-angle X-ray scattering, pair distribution function, computed tomography and various thin film analysis techniques. Data Collector provides a logical, unambiguous, single workflow for all these applications. Switching from point or line detector applications to area detector measurements does not require the execution of different data acquisition software packages; it can all be done within Data Collector.



Data Collector, PANalytical

Easy experiment setup and execution

Data Collector contains advanced features to help set up the right experiment to produce the right results. Data Collector contains a library of predefined measurement routines for theta-2theta scans, 2theta only scans as well as omega-2theta scans. Sample positioning is also handled conveniently, whether it is phi, chi, X, Y or Z: they can easily be programmed and automatically be optimized by Data Collector.
Also setting up measurement routines containing various X-ray diffraction scans in combination with sample positioning and optimization can be done conveniently with Data Collector's batch programming capabilities. It includes automatic control of the temperature
for in situ XRD experiments, and automatic sample height
compensation. When changing from one experimental setup
to another, Data Collector wizards guide you through that
process. Data Collector also features automatic validation of
the experimental setup.


Data Collector, PANalytical

Open XML file formats

Storing raw measurement data together with all measurement parameters is of the utmost importance. XRDML files that are written by Data Collector make this possible by using the open XML format. XRDML files guarantee convenient data storage, accessibility and archiving. Users have access to all instrument settings and measurement parameters to repeat the measurement. Also, the XRDML format is fully open enabling user-input routines for analyzing diffraction data. Measurement programs are stored in XRDMP files that also use the open XML format. XRDMP files allow sharing of lengthy measurement programs or safe storage on the company server.



Data Collector, PANalytical

Easy previewing of data with Data Viewer and Area Director

For a quick display and comparison of measurement data, the Data Viewer program is delivered with Data Collector. With Data Viewer it is easy to preview data before performing the final analysis. Users can scale, shift and compare different data sets. It is also possible to export to other commonly used file formats.
For 2D micro-diffraction and 2D SAXS experiments as well as for computed tomography measurements performed with the PIXcel or PIXcel3D 2x2 the Area Director program is available. It allows for a quick overview of 2D or CT measurements. Area Director has also various possibilities to export to commonly used file formats.


Data Collector, PANalytical

Automatic processing program - easy automation of routine tasks

Data Collector also comes with the Automatic Process Program that allows automating routine tasks. For example, users can set up the Automatic Processing Program such that a finished measurement is automatically loaded into HighScore Plus, which then will perform a Rietveld analysis according to the user batch created. Automatic Processing Program works can be used to trigger any software that has a command line interface, such as PANalytical’s wide variety of analysis programs.



Data Collector, PANalytical

Operator Interface – simplifying complex measurements

The Operator Interface is an optional module that allows users (production control operators, analysts or researchers) to graphically create a measurement job that can contain information on how to measure samples as well as on how to analyze them after the measurement.The job is executed via Data Collector on a PANalytical X’Pert³ Powder, X’Pert³ MRD or MRD XL and Empyrean diffractometer system, either equipped with a high-throughput stage, a sample spinner with a sample changer or an MRD XL cradle with a cassette wafer loader. The Operator Interface supports cassette-to-cassette operation, flexible wafer or well plate mapping as well as using the sample table as sample changer.

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