Stress Plus

Features

Data from multiple {hkl} peaks are combined and a conversion algorithm calculates true ψ-tilts for all possible combinations of instrument angles.

Specifications

Stress Plus calculates all intermediate results and final stress data instantly. The influence of all parameters is directly reflected in the final result.

Empyrean, X-ray diffractometer, PANalytical, XRD
Empyrean

With the Empyrean, PANalytical has set the new standard for a multi-purpose diffractometer.

X'Pert³ MRD and MRD (XL)

PANalytical's X'Pert³ Materials Research Diffractometers (MRD) are proven, versatile platforms for X-ray scattering studies.

Residual stress analysis

X-ray diffraction (XRD) is a well-established, non-destructive method for the determination of residual stress in polycrystalline materials.

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Materials research

X-ray diffraction is the only laboratory technique that reveals structural information.
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