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PANalytical's Stress Plus software is dedicated to the X-ray diffraction (XRD) analysis of residual stress in polycrystalline coatings. The software performs sin²ψ residual stress analysis using both single-directional and multi-directional techniques. Stress Plus is an optional module for PANalytical’s Stress software, sharing its key features.
Data from multiple {hkl} peaks are combined and a conversion algorithm calculates true ψ-tilts for all possible combinations of instrument angles.
Stress Plus calculates all intermediate results and final stress data instantly. The influence of all parameters is directly reflected in the final result.
With the Empyrean, PANalytical has set the new standard for a multi-purpose diffractometer.
PANalytical's X'Pert PRO Materials Research Diffractometers (MRD) are proven, versatile platforms for X-ray scattering studies.
X-ray diffraction (XRD) is a well-established, non-destructive method for the determination of residual stress in polycrystalline materials.
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X-ray diffraction is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use XRD to analyze a wide range of materials, from thin films to solids.
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57º Brazilian Ceramic Congress and V Ibero American Ceramic Congress 05/13
PPXRD 5/2013
36ª Annual Meeting of the Brazilian Chemical Society 05/13
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