X'Pert³ MRD (XL)

XPert ProThin Film, PANalytical

X'Pert³ MRD XL

From nanomaterials to bulk samples

The X’Pert³ MRD systems handle the same wide range of applications, and are especially suitable for thin film analysis applications such as rocking curve analysis and reciprocal space mapping, reflectometry, thin film phase analysis and residual stress and texture analysis.

<b>Request</b> a quote Request a quote

To help us respond to your request for a quote please fill in the form as completely as possible.

<b>Contact</b> us Contact us

Please use this form to contact us if you require further information.

What is XRD?
Materials research

X-ray diffraction is the only laboratory technique that reveals structural information.
Read more

Global and near
PANalytical
International

PANalytical has an unrivaled sales and service network covering more than 60 countries.
Read more

Our top XRF products
Zetium
Contributing to your success

The role PANalytical products play in increasing process productivity. Read more

Contact us
PANalytical
Contact us

Please use this form to contact us if you require further information.
Read more