Data storage industries

Contact us
RoHS Data storage, PANalytical

Data storage industries

Development and manufacturing of data storage devices require unprecedented control of extremely thin layers (< 1 nm). XRF and XRR can both meet the challenging requirements for accurate thin film metrology. These proven techniques provide rapid, non-destructive, reliable and accurate access to critical thin film parameters.

PANalytical: a reliable partner for data storage industries

PANalytical provides non-destructive metrology tools for the rapid evaluation of essential properties in modern multi-stack data storage components. Solutions are available for either research and development (R&D) or in-line process control.

The 2830 ZT determines composition, thickness and surface uniformity of semiconductor films and stacks, by measuring elements from B to U. In addition to best-in-class precision, the 2830 ZT offers unprecedented uptime as a result of the elimination of tube intensity drift through ZETA technology. This feature means that calibration maintenance and drift correction are minimized.

State-of-the-art X-ray reflectometry solutions are based on X’Pert³ MRD (XL); offering the benefits of bright X-ray sources, reliable X-ray optics, ultra-high dynamic detectors and X-ray data modeling using the most recent scientific algorithms. Thickness, density and roughness can be quantified accurately and absolutely.

Related application notes
Related news
Related events
What is XRD?
Materials research

X-ray diffraction is the only laboratory technique that reveals structural information.
Read more

Global and near
PANalytical
International

PANalytical has an unrivaled sales and service network covering more than 60 countries.
Read more

Our top XRF products
Zetium
Contributing to your success

The role PANalytical products play in increasing process productivity. Read more

Contact us
PANalytical
Contact us

Please use this form to contact us if you require further information.
Read more