What X-ray diffraction reciprocal space mapping tells you about your material
This webinar focuses on data collection strategies and interpretation of reciprocal space maps from epitaxial layers. A walk through from data collection to data analysis is demonstrated in detailed steps for traditional high-resolution 0D optics and recent fast data collection strategies. The state-of-the-art 2D detectors allowing faster data collection expands the use of this technique from academic research or R&D to rapid quality control applications. Examples will be explained and quantified with our current analysis software Epitaxy 4.3a. Time for questions is reserved.