ZetiumSmart Zetium for reliable results and robust operation |
Axios FASTXRF of choice for highest throughput or shortest measurement time |
2830 ZTAdvanced semiconductor thin film metrology solution |
Epsilon 4Fast and accurate at-line elemental analysis |
X'Pert³ MRDVersatile research & development XRD system |
X'Pert³ MRD XLVersatile research, development & quality control XRD system |
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Measurement type | ||||||
Thin film metrology | ||||||
Technology | ||||||
Wavelength Dispersive X-ray Fluorescence (WDXRF) | ||||||
X-ray Diffraction (XRD) | ||||||
Energy Dispersive X-ray Fluorescence (EDXRF) |