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Wavelength dispersive X-ray fluorescence

PANalytical, XRF

Introduction to wavelength dispersive X-ray fluorescence (WDXRF)

X-ray spectrometry methods to measure elements are founded on Moseley's relationship, showing that the reciprocal of the wavelength of characteristic radiation for any given spectral line of a series (i.e. K, L, M etc.) is directly related to the square of the atomic number. These wavelengths are well documented. By measuring the wavelengths of characteristic X-radiation one can infer the atom from which it originates.
In WDXRF spectrometry, the polychromatic beam emerging from a sample surface is dispersed into its monochromatic constituents by the use of an analyzing crystal according to Bragg's law. The wavelength for any measured line is computed from knowledge of the crystal parameters and diffraction angle. A selection of crystals is necessary in order to cover the wavelength range of interest.

Read more about:
Braggs' law
Sequential WDXRF or
Simultaneous WDXRF

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