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PANalytical

Production quality control and data security

PANalytical delivers systems and support that provide rapid product quality control, excellent raw material FingerPrinting and enhanced data security.

The XRF technique can be used to determine the concentration of major metallic elements, minerals, toxic elements and contaminants. It can also be used with fillers, pigments and other additives without the need of an elaborate laboratory setup and accompanying waste stream.

XRD is a common analysis method to determine the compositional phases, crystal structure and crystallite size in cosmetic materials. Small-angle X-ray scattering (SAXS), a further method, is increasingly being used to measure particle size and size distribution of nanomaterials in cosmetics.

Elemental analysis of cosmetics and sunscreens

XRF measurements are non destructive and thus can be carried out directly on solid and liquid samples. The advantage of this is that sample preparation is less time-consuming, meaning there are time and cost savings. XRF is easy to use, with both short analysis time and simultaneous analysis, leading to a high throughput. A technique which can be used in near-line applications; XRF needs just a push of a button to determine elemental concentrations making quality control more effective. The authenticity of cosmetics can be identified and the product can be reliably reproduced time after time.

Cosmetic authenticity identification and risk management

Unfortunately a reality today is that many brand name manufacturer products are commonly counterfeited and often the burden of proof lies with the brand owner. PANalytical offers unique solutions to aid identification and quantify risks.

Examples of forensic applications and X-ray technologies used by the cosmetic and personal care industry are listed below.

X-ray Diffraction

Empyrean
Typical uses include:
• Comprehensive raw material physical identification and polymorph classification
Nanomaterial research and refinement investigations
• Computed tomography product investigations
• Counterfeit material identification using routine search match, CT and cluster analysis

X’Pert³ Powder
Typical uses include:
• Comprehensive raw material physical identification and polymorph classification
• Nanomaterial research and refinement investigations
• Counterfeit material identification using routine search match and cluster analysis

X-ray Fluorescence

Epsilon 3X spectrometers (energy dispersive XRF)
Typical uses include:
• Elemental and trace heavy metal screening
• Rapid identification of raw materials when combined with FingerPrint
• Counterfeit product identification when combined with FingerPrint
• Standardless material analysis when combined with Omnian

Zetium (wavelength and energy dispersive XRF)
Typical uses include:
• Inorganic material elemental analysis (C to U) for major, minor and trace concentrations from sub ppm to % range
• Standardless material analysis when combined with Omnian

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