Empyrean Nano edition/Gallery
CEMOXI can be used either as a primary fused bead calibration or to verify in-house standards for pressed powder applications (using fusion). Since the use of CRM’s are limited to material available and are expensive, synthetic standards such as CEMOXI offer concentrations and analytical ranges that are tailored while remaining cost effective. The CEMOXI standards have been validated using 25 CRM’s and show excellent agreement.
GEM300 is the catch-all name for the SEMI standards that address 300 mm automation. The software and hardware requirements for automated process control of processing and metrology tools, including the interfaces with automatic, personal and rail-guided vehicles (AGVs, PGVs and RGVs) plus overhead hoisted transports (OHTs) are provided. GEM300 provides a consistent interface towards the factory host, while the SEMI E95 compliant user interface makes the GEM300 functionality available to the user. PANalytical's GEM300 implementation and operational details are continuously verified against the industry standard test package. These capabilities join the standard SEMI SECS/GEM communication standards E4, E5, E30 and E37.1
This highly efficient one-position fusion instrument is ready to use right out of the box and leads to optimized method development.
For advanced thin film analysis, stress, texture and basic powder XRD in reflection at temperatures to 1100 ºC.
Epsilon 1 allows screening and accurate quantification by XRF of many types of samples, for example, ores, rocks, carotagedrill cores and blast-hole chips. The instrument is calibrated with Omnian, PANalytical’s market-leading standardless analysis package, used on our more advanced instruments. As an out-of-the-box solution, Omnian can be used to analyze a wide variety of sample compositions from sodium to americium across the periodic table.
The measurements are carried out directly on the sample itself with little to no sample preparation. Since XRF is a non-destructive technique, the sample can also be measured subsequently by other analytical techniques, if required.
Thanks to the design of HTK 1200N the range of possible applications is broad, from the conventional in situ X-ray diffraction on powder and bulk samples to basic thin film analysis and residual stress measurements. Furthermore, basic small-angle X-ray scattering (SAXS) and total X-ray scattering for pair distribution function analysis (PDF) can also be done with this chamber.
DHS 1100 is a heating attachment designed for advanced thin film applications (phase identification, reflectometry, high-resolution XRD) and advanced residual stress and texture measurements on thin films or bulk samples. Thanks to the compact design of DHS 1100 and optimized integration on Empyrean and X’Pert³ MRD diffractometers reliable sample positioning is easy and straightforward. An optional powder sample holder can be mounted on the heater plate for powder X-ray diffraction in reflection geometry.
XRD provides accurate mineral monitoring and input for hydrometallurgical models to obtain the most economic processing conditions. The Aeris Minerals edition is your partner at every stage of the production process, from raw material to the final product.