Product (456)

The Minerals edition of Aeris/Features

The only automatable benchtop diffractometer for high sample throughput Aeris can be connected with a belt or a robot for fast and automated sample processing. The power of combining technologies The twin solution provides full material characterization by adding elemental composition information from Zetium to the phase identification by Aeris. Industry standard sample holders tailored to your needs • Collection of 51.5 mm sample holders • 40 mm sample holders

OBLF/OES in automation
OBLF/OES in automation

For many years there has been a very close relationship between PANalytical and OBLF where OBLF’s optical emission spectrometers are integrated into PANalytical’s automated laboratory systems for customers in the metals market. As both companies believe in exceptional product quality and robustness together with strong focus on customer satisfaction, the combination provides solid solution for customers in this demanding market. OBLF’s optical emission spectrometers can be integrated by adding the PANalytical’s automation module or even integrate them into the unique hybrid XRF/OES solution TEAMWorks. All OBLF spectrometers are identified by their robustness, high performance, ease of use and limited maintenance requirements. We deliver all instruments factory pre-calibrated running all required recalibration samples to ensure a proper match between the individual spectrometers and the customers' applications. The OBLF QSN 750-II and QSG 750-II can comfortably be integrated in automation systems where the handling of the sample is performed by a non-human device (like a robot). The OBLF GS 1000-II, QSN 750-II and QSG 750-II Optical Emission Spectrometers can even be integrated with the PANalytical simultaneous XRF unit Axios FAST forming the unique hybrid XRF/OES solution 'TEAMWorks'. In case the automation of the Optical Emission Spectrometer is performed by PANalytical, a dedicated robot enclosure (also holding the control- and recalibration samples) ensures full-safe operation even allowing for manual measurement of samples without closing down the automation system. Read more about Automation.

Empyrean/Features

Praised by scientists for its performance, Empyrean allows them to prepare for synchrotron beam time in the best possible way. The unrivalled collection of sample stages and optical components for Empyrean allows applications to be done in various ways: from ‘simple’ by just adding a few slits and analysis software to a standard geometry, to top performance using dedicated optics, sources and detectors. This is ideal for a multipurpose laboratory: if the need for a certain application increases, data quality and throughput time can be improved by adding dedicated modules.

SuperQ Thin Film/GEM200

The SEMI Equipment Communications Standard (SECS) to Generic Equipment Model (GEM) interface is the semiconductor industry's standard for equipment-to-host communications. GEM200 is the PANalytical software module that enables users of PANalytical XRF metrology systems to easily and reliably interface with the wafer production host in compliance with the SECS/GEM standard. In an automated wafer production environment the interface can start and stop equipment processing, collect measurement data, change variables and select recipes for products. Developed by the Semiconductor Equipment and Materials International (SEMI) organization, the standards define a common set of equipment behavior and communications capabilities.