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History and development

Already in 1919 Philips brought the first X-ray tube to the market and in 1945 the first X-ray diffractometer was developed, forming the basis for the founding of the X-ray analysis group within Philips. Under the name of ‘Philips Analytical’ we grew continuously and the successes of our X-ray diffractometers (XRD) and X-ray fluorescence spectrometers (XRF) have made us the world-leader in X-ray analysis equipment. In 2002, PANalytical was incorporated into Spectris as an autonomous operating business. Since 1 January 2017 PANalytical has merged its activities with Malvern Instruments, a UK-based provider of materials and biophysical characterization technology and also an operating company within the Materials Analysis segment of Spectris. We continue to be committed to leadership and innovation, customer satisfaction, safety, environmental health, ethical standards, integrity, fairness, trust and mutual respect. With the increasing demand for on-line systems for the analysis of materials running on conveyor belts, the Sodern PFTNA systems were added to the PANalytical offering palette in 2010. In 2013 ASD Inc. with solutions for remote sensing and mining applications based upon near-infrared spectroscopy (NIR) was incorporated in PANalytical. To complement our offerings for fused sample preparation equipment, Canadian ‘La Corporation Scientific Claisse Inc.’ (‘Claisse’) was added to the PANalytical group of companies in 2014. Currently we are the only analytical X-ray equipment supplier with own in-house development and manufacture of the X-ray tubes, the basis for the best analytical performance. We have over 1000 dedicated employees, are present in virtually all countries of the world, hold more than 250 patents and have research centers in Almelo and Eindhoven, the Netherlands and on the campus of the University of Sussex in Brighton (UK). Our fully equipped application laboratories are established in Japan, China, the United States, Brazil and the Netherlands.

Consultancy

Our consultancy services encompass proactive support, dedicated consultations from PANalytical application specialists, and assistance in the development of optimized analytical methodologies. Customers may, for example, require a straightforward ‘one-off’ program, focused on optimizing a single method. Alternatively, an ongoing program can combine yearly or half-yearly visits from application specialists, with telephone and remote computer support. Such an agreement often begins with an introduction visit from a PANalytical application specialist. This establishes a clear understanding of the operational environment and assesses the potential of the installed system.

Careers

Dare to step into a high-tech world with a strong focus on innovation. At PANalytical you will find ample room for self-confident, committed and client orientated people ready to take on the challenges offered by the company and its customers. Are you the one who is willing to share your talents and pride with your future colleagues? Our culture is open, friendly and approachable and offers a working environment with a wealth of opportunities for personal development. This is your chance to work in an relatively small, yet globally operating organization. We are outstanding as a dynamic company with a stable performance, developing and manufacturing high-quality, high-tech products. But above all, we value people. PANalytical, a company people love to work for.

Customer case 2

Stress measurements on steel are often hampered by a high fluorescent background and peak broadening at high tilt angles, due to sample height misalignment. Use of a parallel beam geometry with Cr radiation can overcome both of these problems. Therefore, we have recently tested a parallel beam X-ray mirror for Cr radiation. Cr radiation reduces the fluorescent background radiation as is observed with copper radiation and provides a proper selection for peaks to be investigated with residual stress analysis. The parallel beam X-ray mirror makes measurements insensitive for sample height misalignment during omega-stress measurements. The parallel beam X-ray mirror is available for our Empyrean.

Fast and accurate at-line elemental analysis

Built on the experience and success of the proven Epsilon 3 range of XRF spectrometers, the Epsilon 4 is a multi-functional instrument for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control. Combining the latest excitation and detection technologies with mature software and smart design, the analytical performance of Epsilon 4 approaches that of more powerful and floor-standing XRF spectrometers. Due to its low infrastructural requirements, Epsilon 4 can be placed next to the production line anywhere in your process. Its high performance enables most applications to be operated at ambient conditions, reducing costs for helium or vacuum maintenance.