In oil refining operations reduction of sulfur ‘giveaway’ can be achieved by improvement of blending sharpness for compliance to Tier 3, Euro VI and other environmental regulations. Excellent repeatability at low sulfur level, visualized in the graph, ensures sharper blending and thus less giveaway.
The Epsilon 3XLE handles a wide variety of sample types, including solids, pressed and loose powders, liquids and filters. It performs non-destructive quantitative analysis of elements from carbon (C) fluorine to americium (Am), in concentrations from 100% down to sub-ppm levels, on samples weighing anything from a few milligrams to kilograms. The Epsilon 3XLE is a robust and reliable alternative to conventional systems for a wide variety of industries and applications, even when light element analysis is of outmost importance, including: cement production, mining, mineral beneficiation, iron, steel and non-ferrous metals, RoHS screening and quantification, petroleum and petrochemicals, polymers and related industries, glass production, forensics, pharmaceuticals, healthcare products, environmental, food and cosmetics.
Energy dispersive X-ray fluorescence spectrometer for the elemental analysis range from carbon (C) to americium (Am) and the concentration range from sub-ppm to 100%. Use Omnian for semi-quantifcation, use FingerPrint for material testing when analysis speed is important or use Stratos for a rapid, simple and non-destructive analysis of coatings, surface layers and multi-layered structures. One could also use Enhanced Data Securitywhich supports compliancy to regulations like FDA 21 CFR Part 11 or use Oil-Trace for quantifying fuel-biofuel mixtures to new and used lubricating oils.
Epsilon 3XLE is a benchtop EDXRF spectrometer that is used for higher sample throughput with improved and extended light element capabilities (C – Am).
Epsilon 3XLE instruments combine the latest excitation and detection technology with state-of-the-art analysis software. The 15 Watt x-ray tube in combination with the high current (3 mA), latest silicon drift detector SDDUltra together with the compact design of the optical path, delivers even better analytical performance than 50 Watt power EDXRF and even benchtop WDXRF systems - with the added bonus of power efficiency. The SDDUltra silicon drift detector fitted in Epsilon 3XLE enables ultra light element analysis of even carbon, nitrogen and oxygen.
The X'Pert³ MRD systems offer advanced and innovative X-ray diffraction solutions from research to process development and process control. The used technologies make all systems field upgradable to all existing options and new developments in hardware and software to come.
To assure that your instrument remains in top condition and performs on the highest level, PANalytical offers a wide range of services. Our Expertise and support services assure an optimal functioning of your instrument.
X'Pert³ Powder is PANalytical’s newest X-ray diffraction system based on the fully renewed X’Pert platform.
PANalytical's X'Pert³ Materials Research Diffractometers (MRD) are proven, versatile platforms for X-ray scattering studies.
With a history of almost 20 years, over 2500 user sites and year-on-year improvements, the X’Pert platform has become the world’s most popular and reliable X-ray powder diffraction instrument. With many innovations adopted from the high-end Empyrean platform, the X’Pert³ Powder is ready for the future.