Product (452)

Epsilon 3X/Specifications

Sample variety The automation option is suited for 51.5 mm PANalytical steel rings. Both pressed powder samples and fused beads can be measured. Other sample types are possible, on request. Operator intervention Ad-hoc samples can be measured by unlocking the cabinet door. The lid of Epsilon 3 will open after the previous measurement is finished. When the cabinet door is open, all moving components are locked to prevent from collisions with the operator. Samples are measured manually without leaving the automation mode. Easy communication Multiple communication possibilities are available for data delivery to LIMS systems via PANalytical’s Universal Automation Interface (UAI) software. Very limited physical connections are required and measurement data from Epsilon 3 software is transmitted automatically in ASCII code for further processing. Fast analytical response It only takes 30 seconds from the time the sample reaches the end of the conveyer belt to the time when the sample is located in the measuring position of the Epsilon 3. With a typical measuring time of 5 to 8 minutes, the total throughput time of the method is less than 10 minutes per sample.

CubiX³ Cement/Features

Users have the option of tailor-made Rietveld solutions, as well as the ability to customize general solutions. Larger laboratories can also be set up to develop central solutions using the full HighScore Plus suite, which can then be deployed to a plant-wide network of CubiX3 Cement instruments. RoboRiet runs at the production plants. It enables the operator to run such Rietveld quantifications completely automatically and transfers the results to a customer defined destination (LIMS, paper, table…).


The X’Celerator covers a wide range of materials research and powder diffraction applications requiring the medium and higher energy range of XRD wavelengths namely X-rays from Co, Cu, Mo, Ag tubes: • Phase identification and high throughput screening • Standardless quantification of mixtures of phases using the Rietveld method • Refinement of crystal structures • Phase transitions at non-ambient conditions using our in situ stages • Phase transitions at non-ambient conditions in combination with our in situ stages • Residual stress, texture and phase identification of metals and alloys • Instances where high sample penetration is required • Pair distribution function (PDF) measurements • Thin film studies