Product (457)

Non-ambient components/Applications

DHS 1100 is a heating attachment designed for advanced thin film applications (phase identification, reflectometry, high-resolution XRD) and advanced residual stress and texture measurements on thin films or bulk samples. Thanks to the compact design of DHS 1100 and optimized integration on Empyrean and X’Pert³ MRD diffractometers reliable sample positioning is easy and straightforward. An optional powder sample holder can be mounted on the heater plate for powder X-ray diffraction in reflection geometry.

Application export and distribution/Features

The application data to be transferred is supplied by the central laboratory and is placed in the correct format on a CD-ROM. Via an upload wizard the application data can be loaded locally from this CD-ROM. The upload wizard takes care that differences between configuration of the spectrometer used to develop the applications and the local spectrometer are accounted for properly. The application data distributed this way can consist of the applications themselves, but can also include calibrations, standards, instrument monitors, etc., enabling a quick startup from everywhere.

The Metals edition of Aeris/Features

The only automatable benchtop diffractometer forhigh sample throughput Fully automatable benchtop connected with belt or a robot The power of combining technologies The twin solution, Aeris and Zetium, provides full material characterization by adding information about elemental composition (determined by Zetium) to the phase identification from Aeris. Industry standard sample holders tailored to your needs • Collection of 51.5 mm sample holders • 40 mm sample holders

Non-ambient components/Applications

The BTS 150 and BTS 500 benchtop heating stages are designed for basic in situ X-ray diffraction on powder samples at low to medium-high temperatures for the study of crystal structure changes, phase transformations, chemical reactions, etc. with both organic and inorganic materials. Furthermore basic thin film analysis (phase composition, basic reflectometry) and basic residual stress measurements on relatively thin samples can also be done with these chambers. Main features, specifications and application examples are summarized in the leaflet below.


The ADPOL module enables easy and accurate elemental analysis of common additive and filler elements. Assisted by ready to use application templates, little effort is needed for optimal system set-up. Your benefit is accurate and trustworthy elemental composition of your polymers, compounds and plastics realized in minutes. Moreover ADPOL is manufactured in close cooperation with DSM Resolve, an industry leader in polymer analysis and close relations with world leading polymer manufacturers.