Product (471)

Expertise/Analysis of a wide range of oxide materials

For process control, exploration, exploitation and quality control in industries such as mineral ores, geology, ceramics, bricks, cement and glass, accurate and frequent elemental analysis is essential. This helps optimize processes and assure product quality and consistency. X-ray fluorescence (XRF) spectroscopy has become an established analytical method for quantifying the elemental composition of oxide materials. XRF has important advantages, such as straightforward sample preparation, accurate and reproducible results and highly automated analysis. These reduce measurement times to a matter of minutes and allow routine analysis to be carried out by factory operators. For accurate analysis, certified standards are essential. The WROXI standards set, which is produced from high-purity chemicals, provides very accurate concentrations. These are traceable, bringing the method closer to being a primary analytical solution. The WROXI standards set is suited for a wide variety of materials, including: silicates, carbonates, phosphates, rocks soils, iron ores, manganese ores, cements.

HighScore Plus/Features

HighScore with the Plus option contains four classical indexing routines (Ito, Dicvol, Treor or McMaille). The unit cell refinement includes zero offset or sample displacement. The space group test is performed on either the full profile (Le Bail fit) or on indexed peaks. A Pawley fit to refine lattice parameters is another possibility. Lattice and structure transformations as well as cell reductions are supported. An automatic standardization of non-standard space group settings is possible while loading such structure data. The symmetry explorer tool contains the crystal symmetry, point- and Laue group, reflection conditions and special positions of all 230 standard space groups. Additional data covers the about 150 non-standard space groups used in the ICSD structure database.