Product (451)


Coal is an important industrial mineral both as a fuel and feedstock. Coal quality can vary greatly depending on the source, hence the usage and price are highly dependent on the composition. Whether located directly at a mine, a coal processing plant, a metallurgical plant, a power plant or other usage point, the CNA³ can provide reliable real-time information on the coal composition, calorific value, ash content, volatile matter, and moisture. The CNA³ neutron generator technology enables measurement of a wide range of elements, including C and O.


The ADPOL module enables easy and accurate elemental analysis of common additive and filler elements. Assisted by ready to use application templates, little effort is needed for optimal system set-up. Your benefit is accurate and trustworthy elemental composition of your polymers, compounds and plastics realized in minutes. Moreover ADPOL is manufactured in close cooperation with DSM Resolve, an industry leader in polymer analysis and close relations with world leading polymer manufacturers.

The Metals edition of Aeris/Applications

XRD is a key technology at every step of the steel making process. It is a valuable tool for rapid and accurate materials characterization of raw and intermediate materials employed in the steel making process (such as iron ore, sinter and direct reduced iron). Application of XRD is also ideal for quality control of the final products as it provides fast and precise quantification of metal phases such as retained austenite. The Aeris Metals edition is your partner at every stage of the production process, from raw material to the final product

Empyrean Nano edition/Features

The unique flexibility to easily and quickly configure the Empyrean Nano edition for the different X-ray scattering techniques is enabled by a 2-circle goniometer platform on which quickly interchangeable, pre-aligned X-ray modules (PreFIX) and sample stages can be mounted. Whereas SAXS measurements can be readily done with a static detector, the goniometer comes into play for accessing the extended angular range that is required for WAXS and ultimately for total scattering (PDF) measurements. With a smallest 2theta step width of 0.0001 deg the high-resolution goniometer also readily supports the USAXS application. For accessing highest possible scattering vectors, the standard Cu X-ray tube can be easily exchanged against a Ag or Mo one.

SuperQ Thin Film/GEM200

The SEMI Equipment Communications Standard (SECS) to Generic Equipment Model (GEM) interface is the semiconductor industry's standard for equipment-to-host communications. GEM200 is the PANalytical software module that enables users of PANalytical XRF metrology systems to easily and reliably interface with the wafer production host in compliance with the SECS/GEM standard. In an automated wafer production environment the interface can start and stop equipment processing, collect measurement data, change variables and select recipes for products. Developed by the Semiconductor Equipment and Materials International (SEMI) organization, the standards define a common set of equipment behavior and communications capabilities.