Product (455)


An outstanding advantage of the Stratos package is that excellent results are achieved with instruments calibrated using conventional bulk XRF standard or reference samples, whose composition and layer structure differ from those of the unknowns. This solves the common problem of obtaining expensive, certified thin films standards that, if available, match production samples as encountered in the analysis of semiconductor wafers and plated metals. If the Omnian option is also available the standards and calibration of Omnian can be directly used for Stratos.


Stratos enables accurate thickness and composition determination for coating and packaging industries. The key advantages include maximized multi-layer capability, minimized calibration costs, full flexibility and ease of use because of the intuitive recipe setup with the aid of the Virtual Analyst and the push-button analysis with automatic reporting. Analysis can be executed without operator intervention and data can be transmitted to a LIMS or - by using UAI - to a factory host system. Results are presented as element percentages                                                                                                                                                                or mass thicknesses.

Stress Plus/Features

A commonly used technique in X-ray diffraction analysis of randomly oriented polycrystalline coatings is to increase the sensitivity of the XRD signal by applying a grazing angle of incidence of the X-rays. In such a geometry, classical residual stress analysis is no longer possible. To overcome this limitation, PANalytical and its collaboration partner, the Max Planck Institute Stuttgart (Germany), have developed pioneering modifications to the classical sin²ψ stress analysis. Data from multiple {hkl} peaks are combined and a conversion algorithm calculates true ψ-tilts for all possible combinations of instrument angles.