Product (453)

Expertise/Polymers and plastics, RoHS

Manufacturers of plastics and polymers are obliged to meet RoHS regulations and ASTM F2617-08 international standards. This legislation defines the maximum allowable concentration for several restricted elements. X-ray fluorescence (XRF) spectroscopy has emerged as a powerful technique for proving regulatory compliance in the polymers and plastics industry. PANalytical’s RoHS package provides certified standards against which to perform XRF analysis. XRF delivers important advantages compared to other techniques. Sample preparation is straightforward, with no dissolution required. Measurements are non-destructive and results are accurate and reproducible. Thanks to the integral smart monitor program, time-consuming and costly re-standardizations are unnecessary and the resultant data are consistent over long periods, saving time and money. Automated analysis reduces measurement times to a matter of minutes and efficient sample preparation methods support high throughput. User-friendly software allows routine analysis to be carried out by factory operators.


The graphical user interface of EasySAXS facilitates particularly easy and efficient access to all software functionalities and parameter settings. Experimental SAXS data and analysis results are shown in two graphics panes. Data can be displayed in various ways, e.g. using lin/log or log/log scales, or in a Guinier, Porod or Kratky plot. A message pane informs about the progress of calculations and displays hints and warnings, when necessary. All data analysis steps, including all details, can be stored in a project file. This allows to resume your analysis at a later point in time or to share your analysis scheme with others. All data can be exported for further processing or display with other software, if desired.


All software functions are seamlessly integrated within the program. Graphics and texts or lists are linked. Editing of graphics results in an immediate update of the text or list, and vice versa. There is a multiple undo/redo possibility available for all functions including batch processing. The size, visibility and contents of every graph or text pane can be customized and stored for future use. Some desktops and skins are predefined. Thumbnails help to select the proper raw data or analysis result. Each task can be executed in multiple ways by user-owned parameter sets.

Search-Match databases/Features

Measured reference patterns often score better for phase identification. The data source is a real powder diffraction measurement made on a pure, carefully selected and characterized material. This is possible even when the crystal structure is unknown. Some databases contain the original powder scan (reference scan) next to the stick pattern. Calculated reference patterns always come with crystal structure data, as required for Rietveld refinements or structure analysis. The data source is a single crystal experiment most of the time. The theoretical stick pattern is calculated from the crystal structure, and, sometimes, optimized for search-match.