Other (294)

Unique solution for in situ XRD at varying gas atmospheres

Anton Paar XRK 900 is a furnace-type heater optimized for in situ powder X-ray diffraction measurements (reflection geometry) at various gas atmospheres in the pressure range from 1 mbar to 10 bars. Due to environmental heating to 900 ºC, high temperature uniformity is guaranteed over the entire sample volume. The thermocouple is placed right underneath the sample for accurate temperature measurement and control. Optional oscillation of the sample table helps to improve the particle statistics for powder XRD in reflection geometry. Sample holders allowing for gas flow through the sample ensure a maximum reaction surface. A special sample holder unit with an additional electrical feed through for battery research at temperatures to 260 ºC is available.

Unique solution for XRD at controlled temperature and humidity

The Anton Paar CHC plus+ chamber is designed for in situ powder X-ray diffraction measurements in reflection geometry and allows performing both high- and low-temperature experiments and experiments with controlled temperature and humidity conditions. The entire temperature range accessible with this chamber is from – 180 ºC to 400 ºC. If cooling below -10 ºC is not required, compressed air cooling can be used instead of liquid nitrogen cooling. The relative humidity can be changed from 5 to 95 %rH at temperatures from 10 to 80 ºC. Optionally a beam knife can be placed above the sample for improved low-angle background. The video on the next slide shows a live demonstration of automatic combined control of temperature and relative humidity.

For XRD at extremely high temperatures

Anton Paar HTK 2000N is a strip heater chamber designed for powder X-ray diffraction in reflection geometry at extremely high temperatures up to 2300 ºC (tungsten strip) in vacuum, air or inert atmosphere. Depending on the experimental requirements, various types of heating strips (Pt, W, Ta; others on request) can be mounted inside the chamber. Due to the direct sample heating the heat-up rate can be as fast as 500 ºC/min (with W strip). The design of the chamber is optimized for a minimum temperature gradient along the heating strip and for maximum position stability of the sample.