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The world’s first 1D silicon strip detector for laboratory X-rays

As the world’s first silicon-based position-sensitive 1D detector for XRD, the X’Celerator is the result of the pioneering development from PANalytical. With the R&D 100 Award-winning X’Celerator detector you can perform XRD measurements up to 100 times faster than with a traditional point detector, without compromising data quality. With no need for cooling water, liquid nitrogen flow, counting gas or time-consuming calibrations, it is a cost-effective solution. The X’Celerator is designed exclusively for PANalytical’s diffractometers for applications in research and industry.

Optimized solution for XRD at controlled temperature and humidity

The Anton Paar MHC-trans chamber is a dedicated chamber for in situ powder X-ray diffraction measurements at controlled temperature and humidity conditions. The chamber is designed for transmission geometry (foils) and has a built-in sample changer with 8 sample positions for high throughput applications. It has an environmental heater enabling temperatures from -10 to 150 ºC in dry atmosphere (dry air or nitrogen gas). The relative humidity can be changed from 5 to 95 %rH at temperatures from 10 to 80 ºC. The thermocouple and humidity sensor are in the direct vicinity of the sample for accurate measurement and control of both temperature and relative humidity. The chamber is equipped with a beam stop for an improved low-angle background. The video on the next slide shows a live demonstration of automatic combined control of temperature and relative humidity.

0D, 1D, 2D, 3D

For a 0D measurement the 2theta position of the detector arm is measured to a high precision together with the total intensity captured on the detector sensor. For each 2theta position a single intensity value is collected. These days 0D applications are texture and stress measurements using an open detector, basic SAXS measurements without an evacuated beam path, high-resolution measurements using a triple- or double-bounce analyzer and reflectometry using a parallel plate collimator and reflectivity slits. Whilst dedicated 0D ‘point’ detectors are available and provide a cost-effective solution, the hybrid pixel detectors are increasingly popular as 0D detectors because of their low intrinsic noise and their capacity to measure the highest intensities without saturation.

Cost-effective attachment for non-ambient XRD

Anton Paar BTS 150 and BTS 500 benchtop heating stages are compact and cost-effective solutions for basic non-ambient X-ray diffraction experiments in reflection geometry. BTS 150 is equipped with a Peltier heating element enabling a temperature range from – 10 ºC to 150 ºC. The resistance heater of BTS 500 allows the heating of a sample from ambient temperature up to 500 ºC. Both heating stages can be used with an air, vacuum or inert gas atmosphere. A thermocouple is placed close to the sample for accurate temperature measurement and control. An optional beam knife can be used to minimize low- angle background.