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Cooperative collaboration

In January 2002, PANalytical and OBLF GmbH announced a formal cooperation agreement between the two companies. Headquartered in Witten, Germany, OBLF offers expertise in optical emission spectrometry for metals and alloys. PANalytical X-ray fluorescence (XRF) spectrometers and OBLF optical emission spectrometers perform complementary roles in the analysis of solid metals. As such, they are ideal for metal analysis laboratories. The agreement includes the exchange of marketing and sales intelligence as well as technical expertise, and extends to the exchange of development knowhow and joint development projects.

Terms & Conditions

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Customer testimonials

"The industrial focus group XUV Optics, part of the MESA+ institute for nanotechnology, is located in a new high-tech lab at the University of Twente (the Netherlands). XUV Optics performs top research in the field of nanotechnology. They specialize in developing multilayer mirrors (e.g. used in space telescopes) and in advanced forms of lithography to generate new computer chips." In the video, lab manager Prof. Dr. Fred Bijkerk and assistant professor Dr. Ir. Robbert van der Kruis explain how PANalytical’s Empyrean X-ray diffractometer contributes to their research.

Sampling
Sampling

In some instances an automated laboratory system must account for treatment of the sample before it is sent to the laboratory. A steel sample, for example, taken from the mold, generally contains a 'pin' where the liquid material entered the sample body. Proper, safe and secure removal of the pin is of vital importance for automated treatment. To remove the pin before the sample is entered into the automated system, a number of methods have been developed - from shearing to cutting. The best method currently available is by using a cut-off wheel. This device, that only makes use of compressed air, is commercially available and fully automatic.

State-of-the-art technology

PANalytical has always been at the forefront of hybrid detector technology. We were the first company to introduce combined 0D and 1D functionality in silicon strip detectors and to expand the onboard flexibility to 0D-1D-2D-3D. The small pixel size, zero background and the high dynamic range of our hybrid detectors bring with them a revolution in the way XRD applications are treated. No longer is it necessary to maximize intensity or 2D detector size. With a choice of optics and operational radii, you can optimize the configuration to really suit your purpose. Read more on our detector portfolio below or contact your local sales representative! It is PANalytical's answer to the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project. PANalytical sells the Pixirad detectors as a top-of-the-range option for its Empyrean X-ray diffraction (XRD) instrument, used for various materials analysis applications.