Other (292)

Cooperative collaboration

In January 2002, PANalytical and OBLF GmbH announced a formal cooperation agreement between the two companies. Headquartered in Witten, Germany, OBLF offers expertise in optical emission spectrometry for metals and alloys. PANalytical X-ray fluorescence (XRF) spectrometers and OBLF optical emission spectrometers perform complementary roles in the analysis of solid metals. As such, they are ideal for metal analysis laboratories. The agreement includes the exchange of marketing and sales intelligence as well as technical expertise, and extends to the exchange of development knowhow and joint development projects.

Terms & Conditions

By accessing and using a Website of PANalytical B.V. ("PANalytical") you agree to the following terms and conditions: Although care has been taken to ensure the accuracy of the information on the PANalytical Website (referred to as "Website"), INFORMATION ON THIS SITE IS PROVIDED WITHOUT ANY REPRESENTATION OR WARRANTY AND IN NO EVENT SHALL PANALYTICAL BE LIABLE IN CONNECTION WITH THE USE OF THE INFORMATION MADE AVAILABLE, UNLESS SPECIFICALLY STATED OTHERWISE. PANalytical does not warrant that the Website or the servers, which make this Website available, are free from viruses or any other harmful elements. PANalytical reserves the right to make changes and/or updates with respect to the information contained on the Website at any time without notice. The Website may provide links to other websites, which are not under the control of PANalytical. PANalytical shall not be responsible in any way for the content of such other websites. PANalytical provides such links only as a convenience, and the inclusion of any link to any such websites does not imply endorsement by PANalytical of the content of such sites. The information provided on the Website may only be used, copied or distributed in unmodified form for informational personal purposes and provided the copyright symbol and notice as set out at the bottom of the page concerned are maintained. This right does not extend to software, unless permitted as set forth in Paragraph 5 below. Software made available for downloading from the Website is licensed subject to the terms of the applicable license agreement. Except as set forth in the applicable license agreement, the software is made available for use by end users only and any further copying, reproduction or redistribution of the software is expressly prohibited. WARRANTIES, IF ANY, WITH RESPECT TO SUCH SOFTWARE SHALL ONLY APPLY AS EXPRESSLY SET FORTH IN THE APPLICABLE LICENSE AGREEMENT. PANALYTICAL HEREBY DISCLAIMS ALL FURTHER WARRANTIES, REPRESENTATIONS AND CONDITIONS WITH REGARD TO SUCH SOFTWARE, INCLUDING ANY IMPLIED WARRANTIES. These terms and conditions shall be governed by and construed in accordance with the laws of The Netherlands. Copyright in the Website and its contents rests with PANalytical B.V. or its licensors. All rights reserved.

Customer testimonials

"The industrial focus group XUV Optics, part of the MESA+ institute for nanotechnology, is located in a new high-tech lab at the University of Twente (the Netherlands). XUV Optics performs top research in the field of nanotechnology. They specialize in developing multilayer mirrors (e.g. used in space telescopes) and in advanced forms of lithography to generate new computer chips." In the video, lab manager Prof. Dr. Fred Bijkerk and assistant professor Dr. Ir. Robbert van der Kruis explain how PANalytical’s Empyrean X-ray diffractometer contributes to their research.


In some instances an automated laboratory system must account for treatment of the sample before it is sent to the laboratory. A steel sample, for example, taken from the mold, generally contains a 'pin' where the liquid material entered the sample body. Proper, safe and secure removal of the pin is of vital importance for automated treatment. To remove the pin before the sample is entered into the automated system, a number of methods have been developed - from shearing to cutting. The best method currently available is by using a cut-off wheel. This device, that only makes use of compressed air, is commercially available and fully automatic.

State-of-the-art technology

PANalytical has always been at the forefront of hybrid detector technology. We were the first company to introduce combined 0D and 1D functionality in silicon strip detectors and to expand the onboard flexibility to 0D-1D-2D-3D. The small pixel size, zero background and the high dynamic range of our hybrid detectors bring with them a revolution in the way XRD applications are treated. No longer is it necessary to maximize intensity or 2D detector size. With a choice of optics and operational radii, you can optimize the configuration to really suit your purpose. Read more on our detector portfolio below or contact your local sales representative! It is PANalytical's answer to the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project. PANalytical sells the Pixirad detectors as a top-of-the-range option for its Empyrean X-ray diffraction (XRD) instrument, used for various materials analysis applications.