Event (332)

What X-ray diffraction reciprocal space mapping tells you about your material

24 March 2014  This webinar focuses on data collection strategies and interpretation of reciprocal space maps from epitaxial layers. A walk through from data collection to data analysis is demonstrated in detailed steps for traditional high-resolution 0D optics and recent fast data collection strategies. The state-of-the-art 2D detectors allowing faster data collection expands the use of this technique from academic research or R&D to rapid quality control applications. Examples will be explained and quantified with our current analysis software Epitaxy 4.3a. Time for questions is reserved.

Practical small spot mapping analysis using SumXcore technology and Zetium

17 April 2015  The latest advances in integrating XRF technology enable bulk analysis and small spot mapping analysis on a single platform. The ability to analyze small areas, or map the distribution of elements on a fine scale, widens the range of applications possible. This facilitates fundamental investigations in production control and materials research. In contrast to other elemental mapping techniques, XRF requires little or no sample preparation. This means that element mapping becomes accessible to users of varying levels of skill and makes it an indispensible tool in scientific research and process troubleshooting. Practical small spot mapping analysis is now possible with the ED core (part of SumXcore technology) of the Zetium XRF spectrometer. Qualitative (intensity-based) or quantitative (concentration-based) applications can be set up, and the multi-element acquisition mode of the ED core makes Omnian standardless applications also possible. In this webinar various applications of small spot analysis mapping will be discussed including qualitative, quantitative and Omnian standardless examples. These include the analysis of a meteor, ceramic and stainless steel to name a few.