Event (332)

What X-ray diffraction reciprocal space mapping tells you about your material

24 March 2014  This webinar focuses on data collection strategies and interpretation of reciprocal space maps from epitaxial layers. A walk through from data collection to data analysis is demonstrated in detailed steps for traditional high-resolution 0D optics and recent fast data collection strategies. The state-of-the-art 2D detectors allowing faster data collection expands the use of this technique from academic research or R&D to rapid quality control applications. Examples will be explained and quantified with our current analysis software Epitaxy 4.3a. Time for questions is reserved.

Extending the CT capability of your multipurpose diffractometer

02 June 2015  Computed tomography (CT) is a non-destructive analysis method that provides information about the structure, material, defects and pore distribution in solid objects by means of 3D reconstruction. The webinar will demonstrate how the CT capability on PANalytical systems can be extended from pharmaceutical products, polymer composites and other relatively light materials to metal- or heavy-element-containing objects by means of high-energy radiation and the new PANalytical GaliPIX3D detector.