Event (330)

Do you want to collect high-quality X-ray reflectometry data? Good practices that will help
Do you want to collect high-quality X-ray reflectometry data? Good practices that will help

19 October 2016  X-ray reflectometry (XRR) is a well-established analytical method for the characterization of thin layered structures, surfaces and interfaces. It is used to determine layer thicknesses and densities and provides roughness-related information. The basics of XRR and the analysis of XRR data were discussed in one of our webinars last year. This time, the focus will be on a typical workflow, from setting up the X-ray optics of a diffractometer, the essential steps of the sample alignment procedures to the final XRR measurement. Don’t miss the useful practices and tips that we will share with you in this webinar. They will help you to collect high-quality XRR data from your layered samples.

Extending the CT capability of your multipurpose diffractometer

02 June 2015  Computed tomography (CT) is a non-destructive analysis method that provides information about the structure, material, defects and pore distribution in solid objects by means of 3D reconstruction. The webinar will demonstrate how the CT capability on PANalytical systems can be extended from pharmaceutical products, polymer composites and other relatively light materials to metal- or heavy-element-containing objects by means of high-energy radiation and the new PANalytical GaliPIX3D detector.