Practical small spot mapping. Analysis of a ceramic inclusion using SumXcore technology
X-ray fluorescence analysis is a nondestructive, straightforward and fast approach to carry out quality control checks on ceramics. However, the size of ceramic inclusions typically requires analysis of a much smaller spot size compared to traditional bulk XRF techniques. This study illustrates the capability of Zetium to perform small spot analysis and elemental distribution mapping of an inclusion in a ceramic.