X-ray fluorescence (XRF) and X-ray diffraction (XRD) are essential techniques for characterizing the elements and crystalline phase composition of materials from the base metals mining processes; from geological mapping through exploration, grade control, beneficiation and quality control.
PANalytical customers can benefit from the fourth generation PFTNA (pulsed fast and thermal neutron activation) technology in Sodern CNA cross-belt on-line analyzers for real-time process control.
In addition we can also offer near-infrared (NIR) spectroscopy in ASD technology as a rapid and reliable analytical technique for mining exploration or process control activities.
Typical applications include:
- Mineral identification for geological exploration
- Elemental analysis for process control
- Grade control for compositional mapping of ore deposits and drill cores
- Optimizing crushing process
Adressing the needs of the base metals industry
Our range of wavelength dispersive (WD) and energy dispersive (ED) spectrometers offer the flexibility and robustness to handle an extensive range of analyses. Zetium sequential spectrometers with dedicated packages such as WROXI, Pro-Trace and Omnian provide highly sensitive and precise elemental analysis, rapid throughput and maximum uptime, essential for this type of industry.
Near-infrared (NIR) reflectance spectroscopy based analysis easily and rapidly identifies many of the minerals that are key to classify alterations in minerals associated with a potential economic ore deposit - the key to fine-tune the exploration process.
With PANalytical's cross-belt on-line analyzers (CNA) resource assessment is possible by accurately measuring ore grade early in the process. No sampling required, material is analyzed continuously on the conveyor belt, therefore analytical data is available in real time.