As layers of pure metals or alloys are used to enhance certain features of a product, it is important to precisely and accurately determine coating thickness. Quality control of metal coatings requires non-destructive, elemental analysis as well as detailed characterization of physical properties. X-ray fluorescence (XRF) and X-ray diffraction (XRD) are non-destructive, non-contact analytical techniques that require little or no sample preparation, making them ideal for this application.
Typical applications include:
- Steel pre-treatment processes
- TiN for machining iron-based materials
- CrC with high temperature oxidation resistance used in die casting
- Tungsten carbide/carbon (WC/C) for coating and protecting highly-loaded precision
components, gears and drives, engine components, hydraulic pumps and compressors
- Conductive coatings such as metalized plastic used in food packaging
Enhancing productivity and reducing waste
PANalytical’s wavelength dispersive (WD) and energy dispersive (ED) XRF spectrometers belonging to the Zetium and Epsilon 4 respectively, deliver the flexibility and robustness needed to meet the stringent analytical demands and workflow requirements of the metal coatings production environment. XRF systems with Stratos software provide an efficient solution for elemental analysis of metal coatings as single or multiple layers.
X-ray diffractometers, such as Empyrean and X’Pert³ MRD, tailored with specific software packages such as Stress Plus, HighScore, Stress and Texture, deliver comprehensive analysis of structural properties, and reliably address the challenges of phase identification, stress and texture analysis. Additionally, Reflectivity is the ideal software solution for the determination of very thin coatings (below 1 μm).