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Comparison of elemental analysis techniques - advantages of XRF in comparison with ICP and AAS

ICP, AAS, ICP-MS, ICP-OES and XRF are traditional techniques used in many industries. Find out the advantages of XRF elemental analysis compared to ICP and AAS.
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Solid-state X-ray detection technology

Find out more about PANalytical’s unique hybrid pixel detectors and the technology behind these detectors!
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- Empyrean
- XRD
- X'Pert³ MRD XL
- X'Pert³ MRD
- RSM
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Reciprocal space mapping

Reciprocal space mapping is a high-resolution X-ray diffraction method to measure a reciprocal space map (RSM). These maps around reciprocal lattice spots can reveal additional information beyond that provided by single line scans such as high-resolution rocking curves.
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Grazing incidence small-angle X-ray scattering

Grazing incidence small-angle X-ray scattering (GISAXS) is applied to thin surface layers containing nanoparticles, pores and other nonhomogeneities with dimensions in the range 1 – 100 nm. GISAXS is used to obtain information about the size, shape and alignment of these nanoscale features.
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XRF sample preparation, glass beads by borate fusion (booklet)

This book provides an introduction to the concept of borate fusion as a sample preparation method for XRF analysis.
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- XRF
- Eagon 2
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XRD for the analyst, getting acquainted with the principles (booklet)

This booklet provides an introduction to X-ray powder diffraction (XRPD or, mostly used, XRD) and provides helpful information. It gives a simple explanation of how a diffractometer works and how XRD analysis is done.
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XRF applications in the semiconductor and data storage industry (booklet)

This booklet describes the major X-ray fluorescence applications in the semiconductor and data storage industries.
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XRD of gallium nitride and related compounds: strain, composition and layer thickness (booklet)

This book provides an introduction to the X-ray diffraction analysis of key structural parameters in epitaxial GaN layers.
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Theory of XRF, getting acquainted with the principles (booklet)

XRF is an analytical technique that can be used to determine the chemical composition of a wide variety of sample types including solids, liquids, slurries and loose powders.
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Near-infrared reflectance spectroscopy

Near-infrared reflectance spectroscopy (NIR) is a highly flexible form of analysis, which can be applied to a broad range of research and industrial process applications.
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- NIR
- Near-Infrared spectrometers
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Pulsed fast thermal neutron activation

Pulsed fast and thermal neutron activation (PFTNA) technology instantaneously delivers highly representative elemental analysis for safe, robust in-line process control in real time.
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X-ray diffraction

XRD is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness.
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Materials research

X-ray diffraction is the only laboratory technique that reveals structural information.
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