High-resolution, high-throughput XRPD
This application note describes the use of a PANalytical X-ray powder diffractometer for high-throughput, high-resolution polymorph screening.
With the development of fast 1D detectors it takes only few minutes to get a high quality XRD pattern per temperature step. However, the drawback of the measurements in para-focusing geometry is a sample height variations due to temperature change. This application note describes how to account for this effect and get an accurate Bragg peak positions.
PANalytical offers a push-button solution according to the ASTM E975 norm, for the quantitative determination of retained austenite using X-ray diffraction. The method provides reliable results and is compliant with international normalization. The dedicated retained austenite software module is easy to use and can be run also by less experienced operators.
This note describes the use of the Rietveld method for determining crystallite sizes of pharmaceutical powder samples.
X-ray diffraction is an established analysis technique used to confirm identity of crystalline substances and it is widely accepted by courts of law. XRD is becoming an invaluable tool.
X’Pert³ Powder and CubiX³ diffraction systems equipped with the X’Celerator detector offer excellent low limits of detection for silica phases – down to 3 μg – and a significantly shorter measurement time compared to traditional point detectors.