Solid-state X-ray detection technology
Find out more about PANalytical’s unique hybrid pixel detectors and the technology behind these detectors!
Find out more about PANalytical’s unique hybrid pixel detectors and the technology behind these detectors!
Reciprocal space mapping is a high-resolution X-ray diffraction method to measure a reciprocal space map (RSM). These maps around reciprocal lattice spots can reveal additional information beyond that provided by single line scans such as high-resolution rocking curves.
Grazing incidence small-angle X-ray scattering (GISAXS) is applied to thin surface layers containing nanoparticles, pores and other nonhomogeneities with dimensions in the range 1 – 100 nm. GISAXS is used to obtain information about the size, shape and alignment of these nanoscale features.
This booklet provides an introduction to X-ray powder diffraction (XRPD or, mostly used, XRD) and provides helpful information. It gives a simple explanation of how a diffractometer works and how XRD analysis is done.
This book provides an introduction to the X-ray diffraction analysis of key structural parameters in epitaxial GaN layers.
XRD is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness.
Crystallography is the basic science underlying the determination of new structures, Rietveld analysis, pair distribution function analysis, texture analysis etc. and is used in many fields of chemistry, mineralogy and physics.
In-plane diffraction refers to a diffraction technique in which both the incident and diffracted beams are nearly parallel to the sample surface.
Line profile analysis or peak shape analysis are used to determine the average crystallite size and lattice strain of nanocrystals from X-ray diffraction (XRD) data.
Almost all engineered materials, such as metals and ceramics, and naturally occurring substances are polycrystalline; they consist of a large number of crystallites.
Phase identification in thin films and surfaces refers to a diffraction technique that enhances the weak diffracted signal which originates from a small diffracted volume of a thin film or near-surface area, during analysis.
X-ray reflectometry (XRR) is an analytical technique for investigating thin layered structures, surfaces and interfaces using the effect of total external reflection of X-rays.