Semiconductor thin films. Analysis of III-V solar cells on silicon substrates
Offcut structures in the form of single crystal AlGaAs/GaAs multilayers on GaAs and Ge substrate wafers and on Ge-on-Si pseudo-substrates were analyzed with an XRD system.
Offcut structures in the form of single crystal AlGaAs/GaAs multilayers on GaAs and Ge substrate wafers and on Ge-on-Si pseudo-substrates were analyzed with an XRD system.
X-ray diffraction is a non-destructive method for the determination of residual stress in polycrystalline materials. Induced by thermal treatment or machining, for example, stress can accumulate during the lifetime of a material.
The identification of major and minor single or multiple phases in an unknown sample is the main application of classical X-ray powder diffraction.
Phase identification in thin films and surfaces refers to a diffraction technique that enhances the weak diffracted signal which originates from a small diffracted volume of a thin film or near-surface area, during analysis.
An application of the Stratos software solution is the analysis of lead in paint films. The Pb content in paint is limited and needs constant screening.
This study demonstrates the powerful capabilities of an Epsilon 4, one of PANalytical’s benchtop EDXRF spectrometers, combined with the Stratos software module for determining the mass thickness of Sn coatings on steel using bulk standard instead of costly in-type standards.
In this webinar there will be an introduction to GISAXS technique together with few application examples.
In this webinar, a general introduction to X-ray reflectivity and general conditions to perform XRR measurements on a laboratory diffractometer are presented.
This study demonstrates the powerful capabilities of an Axios FAST, PANalytical’s simultaneous WDXRF spectrometer, combined with the Stratos software module for determining the mass thickness of Sn coatings on steel using a bulk standard instead of costly in-type standards.
This study demonstrates the powerful capabilities of an Axios FAST, PANalytical’s simultaneous WDXRF spectrometer, combined with the Stratos software module for determining the mass thickness of chrome coatings on steels. This is achieved using two bulk standards instead of costly in-type standards.
Grazing incidence small-angle X-ray scattering (GISAXS) is applied to thin surface layers containing nanoparticles, pores and other nonhomogeneities with dimensions in the range 1 – 100 nm. GISAXS is used to obtain information about the size, shape and alignment of these nanoscale features.
This webinar focuses on data collection strategies and interpretation of reciprocal space maps from epitaxial layers. A walk through from data collection to data analysis is demonstrated in detailed steps for traditional high-resolution 0D optics and recent fast data collection strategies. The state-of-the-art 2D detectors allowing faster data collection expands the use of this technique from academic research or R&D to rapid quality control applications. Examples will be explained and quantified with our current analysis software Epitaxy 4.3a. Time for questions is reserved.