June 05 - June 05
What X-ray diffraction reciprocal space mapping tells you about your material
This webinar focuses on data collection strategies and interpretation of reciprocal space maps from epitaxial layers. A walk through from data collection to data analysis is demonstrated in detailed steps for traditional high-resolution 0D optics and recent fast data collection strategies.
The state-of-the-art 2D detectors allowing faster data collection expands the use of this technique from academic research or R&D to rapid quality control applications. Examples will be explained and quantified with our current analysis software Epitaxy 4.3a. Time for questions is reserved.
Date: Thursday, June 5, 2014
Time: 10:00 AM - 11:00 AM EDT (4:00 PM - 5:00 PM CET)
Panelist information: Lars Grieger, Application Specialit XRD, PANalytical B.V. Almelo.
Lars is a materials engineer with university degrees from RWTH Aachen, and Imperial College London. His work experience work so far spans PVDF based biomedical implants, carbon composite propeller blades, Friction reduction on CrN PVD tool coatings, Lab-on-chip Ag nanoparticle synthesis and nitride semiconductor epitaxy. In 2011 he joined PANalytical as Application and Product specialist XRD, in Almelo (The Netherlands).
- What X-ray diffraction reciprocal space mapping tells you about your material
- 5 June 2014, 10:00 - 5 June 2014, 11:00
- UTC-04:00 US/Eastern