June 26 - June 26
We see what you cannot! – Partial Least Square Regression (PLSR) for industrial XRD applications
Quantitative phase analysis using X-ray diffraction (XRD) became a standard tool for process optimization and quality control in industrial environments such as mining, metals production or building material industries.
A common method is the full pattern Rietveld quantification using structural methods to extract/predict information from the full pattern using physical models and fitting techniques. Sometimes this approach is stretched to its limits. That usually happens, when no realistic physical model is available, or when the model is either too complex or doesn’t fit to reality.
In such cases there is one very elegant way out: multivariate statistics and Partial Least-Squares Regression. This technique is rather popular in spectroscopy as well as in a number of science fields like biosciences, proteomics and social sciences.
We will show a number of cases where PLSR can be used in industrial environments to easily and precisely predict properties like crystallinity, process parameters, components and more directly from XRD data.
The webinar targets industrial as well as academic XRD users that are familiar with XRD but want to look “out of the box” towards new methods.
Date: Thursday, June 26, 2014
Time: 10:00 AM - 11:00 AM EDT (4:00 PM - 5:00 PM CET)
Panelist information: Dr. Uwe König, Segment Specialist Mining XRD, PANalytical B.V., the Netherlands.
Dr. Uwe König studied mineralogy and geology at the Martin-Luther-University Halle (Germany), with a master thesis on the quantification of iron ores using X-ray diffraction and the Rietveld method and a PhD thesis on synthesis and characterization of manganeous layered double hydroxides (LDHs).
In 2005 Uwe König joined the company as application- and product specialist. His focus is the development of new XRD applications for the mining, minerals and metals industry.
- We see what you cannot! – Partial Least Square Regression (PLSR) for industrial XRD applications
- 26 June 2014, 10:00 - 26 June 2014, 11:00
- UTC-04:00 US/Eastern