November 10 - November 10
Redefining benchtop XRD: See how process monitoring in mining is made easy
Decreasing ore qualities and increasing prices for raw materials require a better control of ore processing and a more efficient use of energy. Traditionally, quality control in mining industries has relied on time- consuming wet-chemical analysis of the elemental composition. The mineralogy that defines the physical properties is often only monitored infrequently. Direct monitoring of minerals and process parameters does make the difference in describing ore bodies and the efficiency of the beneficiation process.
A full mineralogical analysis with X-ray diffraction (XRD) helps to increase mineral recoveries in the most effective and environmentally friendly way. X-ray diffraction is an easy-to-use technology, which is not user-dependent.
PANalytical now introduces the first benchtop X-ray diffractometer that is fully automatable and is from the ground up designed for ease of use. In this webinar, we will illustrate the benefits of PANalytical’s benchtop XRD instrument and show how it can address the needs of monitoring the processing of ores from the raw ore to the concentrate. The webinar targets industrial as well as academic XRD users from the mining and related industries.
Recorded on November 10, 2016
Duration: 50 minutes
Panelist: Uwe König, Segment Manager Mining, PANalytical B.V., the Netherlands.
Uwe studied mineralogy and geology at the Martin-Luther-University Halle (Germany), with a master thesis on the quantification of iron ores using X-ray diffraction and the Rietveld method and a PhD thesis on synthesis and characterization of manganeous layered double hydroxides (LDHs). In 2005 Uwe König joined PANalytical as application- and product specialist. His focus is the development of new XRD applications for the mining, minerals and metals industry.
- Redefining benchtop XRD: See how process monitoring in mining is made easy
- 10 November 2016, 16:00 - 10 November 2016, 17:00
- UTC+01:00 Europe/Amsterdam