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October 24 - October 27

Quantitative analysis of X-ray powder diffraction data using HighScore Plus

Target group

The course will provide training on quantitative analysis of X-ray powder diffraction data using several whole pattern fitting techniques available in HighScore Plus XRD software, such as profile fitting and the Rietveld method. These techniques are used to quantify phase content (i.e. quantitative phase analysis, determining how much of each phase is present in a mixture), to quanitfy amorphous content, to calculate nanocrystallite size and microstrain, to index unit cells and refine lattice parameters, and to refine crystal structures including atom positions and occupancies. This course will also include discussion about procedures for collecting data that will provide accurate quantitative results.

This course is a comprehensive software suite with many functions for X-ray powder diffraction data analysis. Basic functionality, such as phase identification and pattern treatment (background fitting, peak search) are taught in a separate course, the Basic X-ray diffraction application course. A brief review of these functions will be provided in this course, but attendees should already have a basic knowledge of these functions.

A tablet PC will be given to the participants and will contain the course materials.

Course details

Location: Georgia Tech, Atlanta, Georgia, United States
Language: English
Course duration: 4 days
Course cost:
$2500.00 - Industry
$1500.00 - Academia
(Lunches included. Travel, lodging, and other meals not included)

Send your questions to:

Jessica Lopes
PANalytical Inc.
117 Flanders Rd.
Westborough, MA 01581
United States
Tel: +1 (508) 647-1196

  • Quantitative analysis of X-ray powder diffraction data using HighScore Plus
  • Georgia Tech, Atlanta, Georgia
  • 24 October 2017, 08:00 - 27 October 2017, 17:00
  • UTC-04:00 America/New York

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